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Optical Inspection Equipment Product List and Ranking from 5 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:May 27, 2026～Jun 23, 2026
This ranking is based on the number of page views on our site.

Optical Inspection Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:May 27, 2026～Jun 23, 2026
This ranking is based on the number of page views on our site.

  1. 東芝情報システム Kanagawa//software
  2. アルファエレクトロニクス Saitama//Other manufacturing
  3. スミックス Kanagawa//Optical Instruments
  4. 4 吉城光科学 本社 Fukushima//Glass and clay products
  5. 4 日本CBL Tokyo//Industrial Machinery
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Optical Inspection Equipment Product ranking

Last Updated： Aggregation Period:May 27, 2026～Jun 23, 2026
This ranking is based on the number of page views on our site.

  1. Curved Surface Correspondence / Micro Defect Inspection Optical Inspection Technology OneShotBRDF 東芝情報システム
  2. Surface Roughness Visualization Unit | Capturing Nano-Level Crystal Defects at a Macro Scale スミックス
  3. Optical Inspection Device Smart LITE VS700 アルファエレクトロニクス
  4. Inspection technology of Yoshikawa Photonics 吉城光科学 本社
  5. Optical Inspection Device Smart LITE VS700 アルファエレクトロニクス

Optical Inspection Equipment Product List

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Optical inspection device 'CE600-SE/VA/CR'

Optical inspection device 'CE600-SE/VA/CR'

Control of translucent labels is based on advanced smart sensors! Introduction of optical inspection equipment for labels.

We would like to introduce the optical inspection device 'CE600-SE/VA/CR' manufactured by FT SYSTEM, handled by Japan CBL. The LABEL CONTROL MACHINE is ideal for ensuring the presence of opaque or partially transparent labels on various types of containers, regardless of whether they are partial or wrap-around. The configuration of the label presence system is defined according to the type of container and label applied. Control of translucent labels is based on advanced smart sensors. 【Features】 ■ Technology: Optical ■ Application: For labels ■ Inline *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices
  • Other machine elements
  • Optical Measuring Instruments
  • Optical Inspection Equipment

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Curved Surface Correspondence / Micro Defect Inspection Optical Inspection Technology OneShotBRDF

Curved Surface Correspondence / Micro Defect Inspection Optical Inspection Technology OneShotBRDF

It does not miss tiny scratches and foreign objects with a depth of a few micrometers. Defect detection, which relied on visual inspection, is captured and detected in one shot using our unique scattered light detection technology!

Are there any issues with "curved and fine defect inspection" in the manufacturing site and appearance inspection process? ● Fine scratches and unevenness are not visible due to curved and 3D shapes ● Strong reflections on glossy and matte surfaces make stable inspection difficult ● Imaging from multiple directions is necessary, slowing down the inspection cycle ● The equipment configuration is complex and high-cost due to the need for curved surface compatibility ▼ Leave it to the optical inspection technology OneShotBRDF! ――― Features ―――――――――――――――――――――― ◆ Compatible with curved and 3D shapes ◆ High-speed inspection through one-shot imaging ◆ Scattered light is color-separated to visualize fine defects ――――――――――――――――――――――――――― OneShotBRDF is an optical inspection technology that utilizes Toshiba's unique scattered light analysis technology. By using a multi-wavelength coaxial aperture filter that selects the angle of light reflection, it visualizes fine scratches and unevenness in complex surface conditions such as curved, glossy, and matte surfaces in a single shot.

  • スライド8.PNG
  • スライド7.PNG
  • Visual Inspection Equipment
  • Other microscopes
  • Defect Inspection Equipment
  • Optical Inspection Equipment

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Optical Inspection Device Smart LITE VS700

Optical Inspection Device Smart LITE VS700

Landing in Japan from Germany: Ideal for inspecting raw substrates! Perfect inspection through high-speed scanning and high-resolution imaging.

We inspect the distortion and processing errors of the circuit board based on the DXF files and Gerber data.

  • smarLITE VS700-2.JPG
  • Circuit Board Inspection Equipment
  • Optical Inspection Equipment

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Inspection technology of Yoshikawa Photonics

Inspection technology of Yoshikawa Photonics

Challenging limitless quality assurance! Visual inspection allows for defect detection in the order of a few micrometers.

We would like to introduce the inspection technology of Yoshikawa Optical Science. By improving the inspection environment and inspection technology, it is possible to detect defects in the order of a few micrometers through visual inspection. Additionally, we are advancing the automation of inspections using microscopes to eliminate human error, making it possible to satisfy customer needs. 【Main Equipment (Excerpt)】 ■ Laser Interferometer (with φ150 analysis device) ■ Laser Interferometer (φ60) ■ Autocollimator ■ Projector ■ Spectrophotometer ■ Laser Photometer *For more details, please refer to the PDF document or feel free to contact us.

  • Glass
  • Processing Contract
  • Contract Inspection
  • Optical Inspection Equipment

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Surface Roughness Visualization Unit | Capturing Nano-Level Crystal Defects at a Macro Scale

Surface Roughness Visualization Unit | Capturing Nano-Level Crystal Defects at a Macro Scale

Visualizing minute changes of 3nm. By using an off-axis optical system and edge reflection light detection, we capture the distortion and scratches on the wafer surface in a wide area at once.

This is a unit that visualizes fine irregularities, scratches, and distortions on the wafer surfaces of materials like Si, SiC, and GaN, which are difficult to detect with the naked eye or under a microscope. It employs Sumix's unique "off-axis optical system" to sensitively detect changes in light reflection (edge reflected light) due to the angle of the surface. 【Defects that can be visualized】 ■ Nano-level surface irregularities and crystal defects ■ Slurry residues and fine scratches ■ Chipping and cracking after dicing It allows for a quick grasp of wide-area "inconsistencies" that are often overlooked in sampling inspections with a microscope, presented as macro images. This helps to eliminate bottlenecks in the inspection process and dramatically improves the accuracy of quality control. *For more details, please refer to the catalog or feel free to contact us. *We are currently accepting requests for evaluations of the actual device. The first sample evaluation will be provided free of charge.

  • Other optical parts
  • Optical Inspection Equipment

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Optical Inspection Device Smart LITE VS700

Optical Inspection Device Smart LITE VS700

Landing in Japan from Germany: Ideal for inspecting raw substrates! Perfect inspection through high-speed scanning and high-definition imaging.

We inspect the distortion and processing errors of the circuit board based on the DXF files and Gerber data.

  • smarLITE VS700-2.JPG
  • Circuit Board Inspection Equipment
  • Optical Inspection Equipment

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